Subject: Aeronautics
Number of records: 2. Vendroux, G. and Knauss, W. G. (1994) Deformation Measurements at the Sub-Micron Size Scale: II. Refinements in the Algorithm for Digital Image Correction. Technical Report. California Institute of Technology, Pasadena, CA. Vendroux, G. and Knauss, W. G. (1994) Submicron Deformation Field Measurements II: Improved Digital Image Correlation. Technical Report. California Institute of Technology, Pasadena, CA. This list was generated on Thu Nov 20 00:48:03 PST 2008. |